Telcordia Sr-332 Issue 3 Pdf [better] Direct

Reliability Prediction Standards - SR332 - Telcordia Issue 3

For semiconductor devices, determine the (as a ratio of rated voltage) and junction temperature . Use the formula: [ T_j = T_ambient + (P_diss \times \theta_ja) ] telcordia sr-332 issue 3 pdf

(\lambda = 9.0 + 24.0 + 3.96 = 36.96) FIT. MTBF = (10^9 / 36.96 \approx 27) million hours (≈ 3,080 years). Reliability Prediction Standards - SR332 - Telcordia Issue